Manufacturer: Park Systems, South Korea

Complete AFM System Complete Atomic Force Microscope system for small and medium size samples, consisting of flexure-guided XY scanner (select preferred option from below), AFM head (select preferred option from below), direct on-axis optics (select preferred option from below), sample mount, motorized XY stage, motorized Z stage, motorized focus stage, NX control electronics, SmartScanTM software, XEI software, computer, monitors, cabinet, table and accessories. 50 μm XY Scanner

▪ Default XY Scanner

▪ Flexure-guided XY scanner structure for the sample scanning and positioning, separated from the topography feedback mechanism of the Z scanner

▪ Flexure-guided structure minimizes background curvature

▪ XY scan range: 50 µm × 50 µm typical ▪ Closed-loop feedback control for precise XY positioning

▪ 20-bit XY position control and 24-bit XY positioning sensor

▪ NOTE: If desires other than default 50 x 50 μm range, select the XY scanner of different scan range. Standard NX AFM Head with Decoupled Flexure- Guided Z Scanner

▪ Default AFM Head ▪ Includes a high-force Z scanner - Flexure-guided structure driven by multilayer piezoelectric actuator - Z scan range: 15 µm - 20-bit Z position control and 24-bit Z position sensor

▪ Includes standard probehand where a cantilever is attached - NCM oscillation frequency: Up to 3 MHz - Bias voltage range to the cantilever: -10 V to 10 V

▪ Detects the deflection of the cantilever using SLD (Super Luminescent Diode) for topography feedback - SLD wavelength: 830 nm - SLD has low coherence to reduce optical interference

▪ Dovetail-lock head mount for easy installation and removal of the AFM head - Automatically connects to the electronics upon installation Direct On-Axis Optics with CCD and LED Illumination (1.2 M Pixel Vision Camera Option) - DEFAULT ▪ Default Camera option

▪ Intuitive direct on-axis sample view from top

▪ Integrated 10x objective lens ▪ 1.2 M Pixel CCD camera

▪ Field of view: 480 µm x 360 µm (with 10x objective lens)

▪ Includes integrated software-controlled white LED illumination*

▪ NOTE: If desires other than default 1.2 M pixel CCD Camera, select the 5 M Pixel Vision Camera Option (080-0066) Computer with Dual Monitors - DEFAULT

▪ Intel® CoreTM i5 CPU or compatible

▪ 16 GB DRAM ▪ 2 x 1 TB Hard Disc Drives

▪ Dual 23 inch LCD monitors (1920 x 1080 pixel, DVI)

▪ Graphic card: GeForce GT1030 or compatible

▪ Operating System: Microsoft Windows 10 Professional 64 bit (English)

▪ NOTE: Specification of the computer is subject to change without notice. Consult Park Systems for details. Sample Mount

▪ Sample plate to place the sample

▪ Sample size - Open space up to 100 x 100 mm (Sample size less than 40 x 40 mm recommended), 20 mm thickness

▪ Includes a magnetic sample holder

▪ Bias voltage range to the sample: -10 V to 10 V Motorized XY Stage

▪ Motorized sample stage for sample positioning in the XY direction ▪ Stage travel range: 20 mm x 20 mm ▪ Stage travel step: 0.6 µm Motorized Z Stage

▪ Motorized stage for AFM head movement in the Z direction

▪ Automatic engage of the cantilever to the sample surface

▪ Stage travel range: 25 mm

▪ Stage travel step: 0.08 µm Motorized Focus Stage for On-Axis Optics

▪ Motorized stage for vision focus

▪ Stage travel range: 15 mm

▪ Stage travel step: ~0.06 µm NX Control Electronics

▪ 17 DACs for signal generation - 2 high-speed 16-bit DACs - 20-bit DACs for X, Y, and Z scanner positioning

▪ 18 ADCs for signal acquisition - 4 high-speed 16-bit ADCs - 24-bit ADCs for X, Y, and Z scanner position sensor

▪ Maximum AFM data size: 4096 x 4096 pixels*

▪ Three channels of integrated digital lock-in amplifier

▪ Digital Q control

▪ 6 digital I/Os in LV-TTL - Image frame, line, pixel, cantilever-modulation sync, tip bias-modulation sync, and alarm

▪ Integrated signal access ports for AFM signals - 7 inputs and 3 outputs

▪ 100 Mbps communication with the PC

▪ CE compliant Standard Modes

▪ Supports standard AFM/SPM modes without additional software/hardware option - True Non-contact mode, Tapping mode, and Phase imaging - Contact mode and LFM (Lateral Force Microscopy) - F/d spectroscopy and Force volume imaging - PinPointTM mode: Includes PinPoint imaging - Fast Imaging - Active Q-control - Spring constant calibration by thermal vibration method Advanced Modes

▪ Performs advanced AFM/SPM modes without additional software/hardware option - MFM (Magnetic Force Microscopy) - Enhanced EFM (EFM, DC-EFM, PFM and KPFM) - FMM (Force Modulation Microscopy) - Nanoindentation PinPointTM Nanomechanical Property Mapping

▪ Provides nanomechanical property mapping mode

▪ Acquired data type: Deformation, Adhesion force, Adhesion energy, Energy dissipation, and Approach and retract stiffness

▪ F/d curve control: Maximum force, Tip traveling range, Speed

▪ Young’s modulus model : Hertzian, JKR and DMT model

▪ Modulus range: Up to 100 GPa, selecting cantilever depends on the sample modulus StepScan Functionality